JEDEC Publishes Test Guidelines for GaN Power Devices

Focus:

The JEDEC Wide Bandgap Power Semiconductor Committee has published its first document—“JEP173: Dynamic On-Resistance Test Method Guidelines for GaN HEMT Based Power Conversion Devices,” which is available for free download from the JEDEC website.

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Author & Publication:

No author specified, press release, Organizational website, Feb 11 2019

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