The Power Supply Designer’s Guide To Radiation Effects in Power Semiconductors

Focus:

This article explains the fundamentals of radiation hardened power semiconductors as well as the practical aspects of using these components. This includes explanations of what happens when different types of charged subatomic particles bombard power semiconductor devices in space and the various types of tests used to qualify rad hard power devices for space. These tests gauge a semiconductor’s ability to withstand different types of radiation effects such as SEE, TID, ELDRS, LET, SEB, and SEGR. These tests are explained in the context of the familiar power transistors and rectifiers. As the author discusses, certain device structures are more vulnerable to specific radiation effects than others, and the design of radiation hardened devices reflects these sensitivities. In some cases, device rating or the choice of power supply topology may be affected, as discussed here. Other topics covered include neutron bombardment, how rad hard applies to integrated circuits, and how to interpret the coding in a space-grade part number.

What you’ll learn:

• How to understand the fundamentals of radiation hardness as applied to power semiconductors
• How to understand rad hard effects and the tests used to gauge semiconductor susceptibility to these effects
• How to understand key design considerations when specifying and applying rad hard power semiconductors

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Author & Publication:

Paul L. Schimel, Microchip Technology, Chicago, Ill., How2Power Today, Jun 15 2020

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