JEDEC Publishes Milestone Document For SiC MOSFETs

Focus:

The JEDEC Wide Bandgap Power Semiconductor Committee has published a milestone document, “JEP184: Guideline for Evaluating Bias Temperature Instability of Silicon Carbide Metal- Oxide-Semiconductor (MOS) Devices for Power Electronic Conversion.

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Author & Publication:

Press release, Business Wire, Apr 30 2021

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