Standard Defines Test Method For Switching Loss In WBG Devices

Focus:

To address switching energy loss in wide-bandgap and silicon power devices, JEDEC has published “JEP200: Test Methods for Switching Energy Loss Associated with Output Capacitance Hysteresis in Semiconductor Power Devices,” which is available for free download.

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Author & Publication:

Press release, Organizational website, Sep 11 2024

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